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Elimination of scan blindness with compact defected ground structures in microstrip phased array

✍ Scribed by Hou, D.-B.; Xiao, S.; Wang, B.-Z.; Jiang, L.; Wang, J.; Hong, W.

Book ID: 117812463
Publisher: The Institution of Engineering and Technology
Year: 2009
Tongue: English
Weight: 541 KB
Volume: 3
Category: Article
ISSN: 1751-8725
DOI: 10.1049/iet-map:20080037

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