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Elimination of kink phenomena and drain current hysteresis in InP-based HEMTs with a direct ohmic structure
✍ Scribed by Sawada, K.; Arai, T.; Takahashi, T.; Hara, N.
- Book ID
- 114616982
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 390 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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