✦ LIBER ✦
Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool
✍ Scribed by Jeynes, C; Barradas, N P; Marriott, P K; Boudreault, G; Jenkin, M; Wendler, E; Webb, R P
- Book ID
- 121386989
- Publisher
- Institute of Physics
- Year
- 2003
- Tongue
- English
- Weight
- 744 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0022-3727
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