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Elemental mapping by means of an ultra-fast XRF spectrometer based on a novel high-performance monolithic array of Silicon Drift Detectors

✍ Scribed by R. Alberti; C. Fiorini; C. Guazzoni; T. Klatka; A. Longoni


Book ID
108223247
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
397 KB
Volume
580
Category
Article
ISSN
0168-9002

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