Elemental and chemical imaging of interfaces with the scanning photoemission microscope on ELETTRA

✍ Scribed by M. P. Kiskinova

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 181 KB
• Volume: 8
• Category: Article
• ISSN: 0899-9457
• DOI: 10.1002/(sici)1098-1098(1997)8:5<462::aid-ima8>3.0.co;2-8

✦ Synopsis

The first results obtained by the scanning photoemission superior to that of the Auger spectra. Also, problems such as microscope on ELETTRA have proved that the photoemission specbeam-induced damage, degradation of the resolution owing to troscopy is approaching the mesoscopic world, thanks to the high excitations induced by the backscatted primary electrons, chargbrightness and coherence of the light provided by the third-generation ing, etc., are less severe when photons are used.

synchrotron sources. The high performance level achieved in spec-