Electrothermal Simulation of Self-Heating in DMOS Transistors up to Thermal Runaway

✍ Scribed by Pfost, Martin; Boianceanu, Cristian; Lohmeyer, Henning; Stecher, Matthias

• Book ID: 124079437
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 805 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/TED.2012.2227484