Electrostatic Reliability Characteristics of GaN Flip-Chip Power Light-Emitting Diodes With Metal–Oxide–Silicon Submount

✍ Scribed by Liann-Be Chang; Kuo-Ling Chiang; Hsin-Yi Chang; Ming-Jer Jeng; Chia-Yi Yen; Cheng-Chen Lin; Yuan-Hsiao Chang; Mu-Jen Lai; Yu-Lin Lee; Tai-Wei Soong

• Book ID: 114619841
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 850 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2033774