๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electrostatic Interactions between Double Layers: Influence of Surface Roughness, Regulation, and Chemical Heterogeneities

โœ Scribed by Duval, J. F. L.; Leermakers, F. A. M.; van Leeuwen, H. P.

Book ID
127287940
Publisher
American Chemical Society
Year
2004
Tongue
English
Weight
362 KB
Volume
20
Category
Article
ISSN
0743-7463

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Atomic Force Microscopy Studies of Membr
Atomic Force Microscopy Studies of Membranes: Effect of Surface Roughness on Double-Layer Interactions and Particle Adhesion
โœ W. Richard Bowen; Teodora A. Doneva ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 134 KB

Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane