๐”– Bobbio Scriptorium
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Electrostatic double layers and plasma evacuation in current-driven systems

โœ Scribed by Kent R. Davey


Book ID
104870751
Publisher
Springer Netherlands
Year
1983
Tongue
English
Weight
693 KB
Volume
95
Category
Article
ISSN
0004-640X

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๐Ÿ“œ SIMILAR VOLUMES


Layer-thickness dependence in tunneling
โœ Maya Watanabe; Hiroshi Toyao; Jun Okabayashi; Takeshi Yamaguchi; Junji Yoshino ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 330 KB

We have investigated the layer-thickness dependence on tunneling magnetoresistance (TMR) in double-barrier structures using GaMnAs-based magnetic tunneling junctions in order to clarify the origin of low threshold current density for current-driven magnetization orientation reversal. The TMR charact