𝔖 Bobbio Scriptorium

✦ LIBER ✦

Electrostatic discharge: mechanisms, protection techniques and effects on integrated circuit reliability

✍ Scribed by L. R. Avery

Book ID: 112184130
Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 563 KB
Volume: 1
Category: Article
ISSN: 0748-8017
DOI: 10.1002/qre.4680010210

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