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Electrooptic coefficient measurements by Mach Zehnder interferometric method: Application of Abelès matrix formalism for thin film polymeric sample description

✍ Scribed by Nitiss, E.; Rutkis, M.; Svilans, M.


Book ID
119337311
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
462 KB
Volume
286
Category
Article
ISSN
0030-4018

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