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Electronic structure of oxygen-vacancy defects in silicon dioxide

✍ Scribed by V. A. Gubanov; A. F. Zatsepin; V. S. Kortov; S. P. Freidman; G. B. Cherlov


Publisher
Springer US
Year
1988
Tongue
English
Weight
421 KB
Volume
49
Category
Article
ISSN
0021-9037

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