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Electronic structure of neutral and charged point defects. A charge self-consistent empirical tight-binding study

✍ Scribed by R. Strehlow; W. Kühn; M. Hanke

Book ID: 104550388
Publisher: John Wiley and Sons
Year: 1986
Tongue: English
Weight: 621 KB
Volume: 134
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.2221340131

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