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Electronic structure of metal/semiconductor interfaces from cathodoluminescence and soft X-ray photoemission spectroscopies

✍ Scribed by L.J. Brillson; I.M. Vitomirov; A. Raisanen; S. Chang; R.E. Viturro; P.D. Kirchner; G.D. Pettit; J.M. Woodall


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
818 KB
Volume
65-66
Category
Article
ISSN
0169-4332

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Electronic structure of UC studied by X-
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X-ray photoemission and bremsstrahlung isochromat spectra are measured for UC. Valence state spectra are compared with the relativistic APW band calculation. Shape analysis of the U 4f core spectrum is made by Doniach-Sunjic lineshape with broadening. The discrepancies between valence spectra and th