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Electronic structure and properties of silicon-transition metal interfaces

✍ Scribed by O. Bisi; L.W. Chiao; K.N. Tu


Book ID
118986230
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
341 KB
Volume
152-153
Category
Article
ISSN
0039-6028

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## Abstract We have investigated metal‐Al~2~O~3~ bonding by AES (Auger electron spectroscopy), EELS (energy electron loss spectroscopy) and XPS (x‐ray photoelectron spectroscopy). The metal–alumina interfaces were formed by __in situ__ vapour deposition and we studied the early stages of metal cond