𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Electronic structure and optical properties of silicon nanowires: A study using x-ray excited optical luminescence and x-ray emission spectroscopy

✍ Scribed by Sham, T. K.; Naftel, S. J.; Kim, P.-S. G.; Sammynaiken, R.; Tang, Y. H.; Coulthard, I.; Moewes, A.; Freeland, J. W.; Hu, Y.-F.; Lee, S. T.

Book ID
125512385
Publisher
The American Physical Society
Year
2004
Tongue
English
Weight
629 KB
Volume
70
Category
Article
ISSN
1098-0121

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Scanning X-ray excited optical luminesce
Scanning X-ray excited optical luminescence microscopy of multi-crystalline silicon
✍ Vyvenko, O. ;Arguirov, T. ;Seifert, W. ;Zizak, I. ;Trushin, M. ;Kittler, M. πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 238 KB

## Abstract In X‐ray beam induced current (XBIC) in combination with X‐ray fluorescence (XRF) and X‐ray absorption (XAS) microscopy techniques is now widely used as a powerful tool for the investigation of transition metal (TM) behavior in Si. The aim of this work was to replace XBIC with a new rec