✦ LIBER ✦
Electronic mobility gap structure and the nature of deep defects in amorphous silicon-germanium alloys grown by photo-CVD
✍ Scribed by Thomas Unold; J. David Cohen
- Book ID
- 115988936
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 273 KB
- Volume
- 164-166
- Category
- Article
- ISSN
- 0022-3093
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