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Electronic instabilities in transition metal doped amorphous silicon dioxide films

✍ Scribed by K.V. Krishna; J.J. Delima; A.E. Owen

Book ID: 118333619
Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 156 KB
Volume: 77-78
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(85)90902-0

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