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Electronic device for the analysis of electron diffraction patterns: A Trzynka and M Takeo, Rev Sci Instrum, 59, 1988, 434–437

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 151 KB
Volume: 39
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(89)90593-9

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📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 146 KB