Electronic Defect States Observed by Cathodoluminescence Spectroscopy at GaN/Sapphire Interfaces

✍ Scribed by X.L. Sun; S.H. Goss; L.J. Brillson; D.C. Look; R.J. Molnar

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 113 KB
• Volume: 228
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200111)228:2<441::aid-pssb441>3.0.co;2-y