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Electronic defect and trap-related current of (Ba[sub 0.4]Sr[sub 0.6])TiO[sub 3] thin films

✍ Scribed by Wang, Yin-Pin; Tseng, Tseung-Yuen

Book ID: 121756763
Publisher: American Institute of Physics
Year: 1997
Tongue: English
Weight: 331 KB
Volume: 81
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.365218

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