Electronic Characterization of Si(100)-Bound Alkyl Monolayers Using Kelvin Probe Force Microscopy

Surface potential studies of self-assemb

Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy

✍ Lü, J.; Eng, L.; Bennewitz, R.; Meyer, E.; Güntherodt, H.-J; Delamarche, E.; Sca 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 307 KB 👁 2 views

The local contact potential di †erence (CPD) of di †erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh