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Electronic characterization of defect sites on Si(001)-(2 × 1) by STM

✍ Scribed by V.A. Ukraintsev; Z. Dohnálek; J.T. Yates Jr.


Book ID
117217654
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
598 KB
Volume
388
Category
Article
ISSN
0039-6028

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