✦ LIBER ✦
Electron Trapping in HfAlO High- Stack for Flash Memory Applications: An Origin of Window Closure During Cycling Operations
✍ Scribed by Xue Feng Zheng; Robinson, C.; Wei Dong Zhang; Jian Fu Zhang; Govoreanu, B.; Van Houdt, J.
- Book ID
- 114620414
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 426 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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