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Electron trapping by excited microvoids (ETEM)—an explanation of the Staebler–Wronski effect

✍ Scribed by Thomas Krüger; Alexander F. Sax

Book ID
108238638
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
418 KB
Volume
353
Category
Article
ISSN
0921-4526

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