Electron transport across bulk (Al/sub x/Ga/sub 1-x/)/sub 0.5/In/sub 0.5/P barriers determined from the I-V characteristics of n-i-n diodes measured between 60 and 310 K

✍ Scribed by Morrison, A.P.; Lambkin, J.D.; van der Poel, C.J.; Valster, A.

• Book ID: 117869727
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 166 KB
• Volume: 36
• Category: Article
• ISSN: 0018-9197
• DOI: 10.1109/3.890277