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Electron transmission probability across CoSi2/n-Si(111) interfaces measured with a scanning tunneling microscope

✍ Scribed by E.Y Lee; H Sirringhaus; H von Känel


Book ID
116066753
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
687 KB
Volume
314
Category
Article
ISSN
0039-6028

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