Electron temperature measurements in uhv systems by spectroscopic and Langmuir probe techniques
β Scribed by TM Desai; SV Gogawale; AB Shukla; NK Joshi; US Salgaonkar; GL Bhale
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 403 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0042-207X
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## Abstract In order to investigate details of anomaly in the Langmuir probe current (I)βvoltage (V) characteristics, electron temperatures and densities are measured by both Langmuir probe and laser Thomson scattering methods. The electron densities measured with both methods show good agreement i
Order-disorder transformations in a quaternary pyrochlore oxide system, Ca-Y-Zr-Ta-O, were studied by powder X-ray diffraction (XRD) method, transmission electron microscope (TEM) and FT-NIR Raman spectroscopic techniques. The solid solutions in different ratios