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Electron spin resonance evidence for the structure of a switching oxide trap: Long term structural change at silicon dangling bond sites in SiO2
✍ Scribed by Conley, John F.; Lenahan, Patrick M.; Lelis, Aivars J.; Oldham, Timothy R.
- Book ID
- 121476638
- Publisher
- American Institute of Physics
- Year
- 1995
- Tongue
- English
- Weight
- 239 KB
- Volume
- 67
- Category
- Article
- ISSN
- 0003-6951
- DOI
- 10.1063/1.115095
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