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Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

✍ Scribed by Stefaan Hoornaert; Boris Treiger; Vlado Valkovic; René Van Grieken


Publisher
Springer
Year
1998
Tongue
English
Weight
762 KB
Volume
128
Category
Article
ISSN
0026-3672

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