Electron paramagnetic resonance of defects in doped microcrystalline silicon : M. Lavado, R. Martins, I. Ferreira, G. Lavareda, E. Fortunato, M. Vieira and L. Guimaraes. Vacuum39(7/8), 791 (1989)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 132 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90231-b