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Electron mobility behaviour for Si(001) inversion layers near mobility threshold below 1.3 K

✍ Scribed by V.V. Borzenets; S. Feher; M. Orendac; S.G. Semenchinsky


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
322 KB
Volume
204
Category
Article
ISSN
0375-9601

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