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Electron microscopy study of nanocrystalline copper deformed by a microhardness indenter

โœ Scribed by Pratibha L. Gai; Kai Zhang; Julia Weertman


Book ID
113896408
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
594 KB
Volume
56
Category
Article
ISSN
1359-6462

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A transmission-electron-microscopy study
โœ A.G. Ives; J.W. Edington; G.P. Rothwell ๐Ÿ“‚ Article ๐Ÿ“… 1970 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 928 KB

A transmission electron microscopy study has been made of the growth of nickel films electrodeposited from a Watts bath at a cd of 1 mA/cms on to vapour-deposited (100) copper films. Average film thicknesses in the range 75-250 A have been studied both in position on the substrate and as separate s