๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electron microscopy of fine-grained extraterrestrial materials

โœ Scribed by Ian D.R. Mackinnon; David S. McKay; Andrew M. Isaacs; GeorgeAnn Nace


Publisher
Elsevier Science
Year
1982
Weight
306 KB
Volume
13
Category
Article
ISSN
0047-7206

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Yield stress of fine grained materials
โœ R.A. Masumura; P.M. Hazzledine; C.S. Pande ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 300 KB

AbstractรA model is proposed for the yield stress of ultra-ยฎne grained materials based upon Coble creep. Using Coble creep with a threshold stress for ยฎner grains and conventional HallยฑPetch strengthening for larger grains, an analytical relation is derived for the yield stress as a function of grai

Electron and optical microscopy studies
โœ M. Szurgot; K. Polaล„ski; M. Krystek ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 494 KB

## Abstract Analytical electron microscopy and optical microscopy were used to determine the elemental and mineral composition of NWA4047 meteorite. The meteorite was found in 2005 in Morocco, and in 2006 was preliminary classified as H4โ€5 ordinary chondrite. The main crystalline meteorite minerals