AbstractรA model is proposed for the yield stress of ultra-ยฎne grained materials based upon Coble creep. Using Coble creep with a threshold stress for ยฎner grains and conventional HallยฑPetch strengthening for larger grains, an analytical relation is derived for the yield stress as a function of grai
โฆ LIBER โฆ
Electron microscopy of fine-grained extraterrestrial materials
โ Scribed by Ian D.R. Mackinnon; David S. McKay; Andrew M. Isaacs; GeorgeAnn Nace
- Publisher
- Elsevier Science
- Year
- 1982
- Weight
- 306 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0047-7206
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