✦ LIBER ✦
Electron Microscopy of Defects in Epitaxical β-SiC Thin Films Grown on Silicon and Carbon {0001} Faces of α-SiC Substrates
✍ Scribed by Karren L. More; Hua Shuang Kong†; Jeffrey T. Glass; Robert F. Davis
- Book ID
- 110824660
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 702 KB
- Volume
- 73
- Category
- Article
- ISSN
- 0002-7820
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