✦ LIBER ✦
Electron microscopy examination of R5T4 alloys, where R = Ho, Yb and Gd, and T = Si, Ge, Ga and Sb
✍ Scribed by Z. Qian; L.S. Chumbley; S. Misra; G. Miller; V.K. Pecharsky; K.A. Gschneidner Jr.; K. Ahn; A.S. Chernyshov; N.K. Singh
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 852 KB
- Volume
- 57
- Category
- Article
- ISSN
- 1359-6454
No coin nor oath required. For personal study only.
✦ Synopsis
Optical and electron micrographs reveal that R 5 (Si x Ge 1-x ) 3 -type compounds, existing as thin plates, are prevalent in R 5 (Si x ,Ge 1-x ) 4 compound systems. The purpose of this research is an attempt to improve understanding of the formation of these thin plates by extending microstructural examination to other R 5 (Si x Ge 1-x ) 4 systems where formation of R 5 (Si x Ge 1-x ) 3 compounds may face additional constraints.