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Electron microscopy and X-ray diffraction studies of polyaniline films

✍ Scribed by Shevchenko, V.V; Yemelina, L.V; Kogan, Ya.L; Gedrovich, G.V; Savchenko, V.I

Book ID: 120290588
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 192 KB
Volume: 37
Category: Article
ISSN: 0379-6779
DOI: 10.1016/0379-6779(90)90126-6

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