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Electron microscopic phase analysis of BN-thin films

✍ Scribed by R�der, M. ;Hahn, J. ;Falke, U. ;Schulze, S. ;Richter, F. ;Hietschold, M.


Publisher
Springer-Verlag
Year
1997
Weight
911 KB
Volume
125
Category
Article
ISSN
0344-838X

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