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Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathodoluminescence

✍ Scribed by Fitting, H.-J. ;Fitting Kourkoutis, L. ;Schmidt, B. ;Liedke, B. ;Ivanova, E. V. ;Zamoryanskaya, M. V. ;Pustovarov, V. A. ;Zatsepin, A. F.


Book ID
112180963
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
908 KB
Volume
209
Category
Article
ISSN
0031-8965

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