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Electron Microprobe Characterization of the Stoichiometry and Homogeneity of Mixed-Crystal Semiconductor Materials

โœ Scribed by Smith, James P.; Kraus, Herbert


Book ID
115358378
Publisher
Society for Applied Spectroscopy
Year
1970
Tongue
English
Weight
263 KB
Volume
24
Category
Article
ISSN
0003-7028

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## Abstract The application of various parameters for the estimation of the degree of homogenization of Cu๏ฃฟNi sinters is investigated. For this purpose specimens were prepared with different Ni contents, different degrees of initial porosity and different sintering periods. Analysis is done by mean