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Electron lifetime due to optical-phonon scattering in a graphene sheet

✍ Scribed by Suzuura, Hidekatsu; Ando, Tsuneya


Book ID
124082384
Publisher
Institute of Physics
Year
2009
Tongue
English
Weight
407 KB
Volume
150
Category
Article
ISSN
1742-6588

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Systematic measurements by light scattering of the hnewidth and frequency shift of the q =0 op- tical phonon in silicon over the temperature range of 5--1400 K are presented. Both the linevyidth and frequency shift exhibit a quadratic dependence on temperature at high temperatures. This indi- cates