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Electron irradiation of silicon dioxide: a non-destructive measurement of the in-depth induced compositional changes

✍ Scribed by L. Calliari; F. Marchetti

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 330 KB
Volume: 59
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(92)90171-s

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