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Electron irradiation-induced defects in lithium doped n-type silicon with different oxygen concentrations

✍ Scribed by Xiuchen Yao; Guogang Qin; Taotao Jia; Shouli Luo; Liqiao Lan


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
453 KB
Volume
129
Category
Article
ISSN
0375-9601

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