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Electron injection characteristics of MNOS nonvolatile semiconductor memory structure using the reverse breakdown of the PN junction

✍ Scribed by Kazunori Ohnishi; Katsuhiro Miura


Book ID
112078636
Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
555 KB
Volume
75
Category
Article
ISSN
8756-663X

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