Electron-induced dissociation of monolayer C2H5Cl on Ag(111). Electron energy dependence

✍ Scribed by Z.-M. Liu; X.-L. Zhou; J.M. White

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 489 KB
• Volume: 198
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(92)85038-c

✦ Synopsis

Electron-induced dissociation (EID) of monolayer CIHSCl on Ag( 1 I 1) has been studied using a novel low-energy photoelectron source. As a function of electron energy, the C-Cl bond dissociation cross section drops by more than an order of magnitude between 0.5 and 3 eV. It rises again by an order of magnitude between 8 and 12 eV, and then rises slowly to 50 eV. Above 8 eV, the EID cross section is attributed mainly to n(C1) and o(CC1) valence level ionization, whereas between 0.5 and 3 eV, it is attributed to dissociative electron attachment.