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Electron impact ionization of tetramethylsilane (TMS)

✍ Scribed by R Basner; R Foest; M Schmidt; F Sigeneger; P Kurunczi; K Becker; H Deutsch

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 913 KB
Volume: 153
Category: Article
ISSN: 0168-1176
DOI: 10.1016/0168-1176(95)04352-7

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