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Electron field emission from amorphous carbon films as a function of deposition self bias, nitrogen content and substrate resistivity — experiment and simulation

✍ Scribed by R.D. Forrest; G.Y. Chen; S.R.P. Silva


Book ID
114192839
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
97 KB
Volume
72
Category
Article
ISSN
0254-0584

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