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Electron emission induced by H+ and H0 incident on thin carbon foils: influence of charge changing processes

✍ Scribed by N. Pauly; A. Dubus; M. Rösler; H. Rothard; A. Clouvas; C. Potiriadis

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 266 KB
Volume: 230
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2004.12.084

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✦ Synopsis

The forward and backward electron emission yields c F and c B have been calculated by Monte Carlo simulation for protons (H + ) and hydrogen atoms (H 0 ) (with energies between 25 keV and 5 MeV) incident on thin amorphous carbon foils. Direct electron excitations by the incident projectiles as well as electron excitations resulting from charge exchange processes undergone by H + or H 0 have been taken into account. For the latter, Auger and Shell processes have been considered. Subsequent electron transport has been considered in order to calculate the forward and backward electron emission yields c F and c B .

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