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Electron emission and related properties of amorphous thin films of mixed barium and silicon oxides

✍ Scribed by A. Abidi; C.A. Hogarth

Book ID
107862012
Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
582 KB
Volume
22
Category
Article
ISSN
0040-6090

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## Abstract Scanning probe methods (SPMs) such as conductive atomic force microscopy (C‐AFM) can be used to probe the structure and local conductivity of the mixed phase silicon thin films with nanometer resolution. Effective medium approximations (EMAs) were used to relate the nanoscale properties