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Electron density and electron temperature measurement in a bi-Maxwellian electron distribution using a derivative method of Langmuir probes

✍ Scribed by Choi, Ikjin; Chung, ChinWook; Youn Moon, Se


Book ID
120835459
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
914 KB
Volume
20
Category
Article
ISSN
1070-664X

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